Manufacturer:Jeol
Model Number:PH01135-1STIG/AFC
Module Type:SEM Control Module
Electron Beam Control Range:1 nm to 100 nm
Voltage Range:1 kV to 30 kV
Resolution:0.1 nm at 30 kV
Compatibility:Jeol SEM Systems
The Jeol PH01135-1STIG/AFC is engineered to deliver unparalleled precision and reliability in electron microscopy applications.
Designed for the most demanding research environments, this module integrates seamlessly with SEM systems to enhance image quality through advanced stigmator adjustment and auto focus correction capabilities.
Its robust construction ensures long-term stability and durability, making it an essential component for any electron microscope setup.
The compact design minimizes space requirements without compromising on functionality, allowing for flexible integration into existing laboratory setups.
Experience the difference with Jeol’s commitment to innovation and excellence in electron microscopy.
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